CALCRT

Description:

CALCRT is an acronym for CALCulation of Reflectance and Transmittance and is a model developed and used at the Arnold Engineering Development Center (AEDC) for calculating reflectance and transmittance of optical surfaces as a function of contaminant film thickness. This model has been very beneficial for determining the contaminant optical effects on cryogenic mirrors and windows. The model requires inputs of the refractive (n) and absorptive (k) indices for both the substrate and contaminant film. These indices for gases condensed at 20K and 77K have been determined in previous experimental/analytical programs for thin solid films of H2O, CO2, NH3, N2, O2, CO, HCl, NO, Ar, CH4, air, hydrazine, monomethyl hydrazine, and dinitrogen tetroxide (N2O4). The reflectance and transmittance can be calculated as a function of wavelength, incidence angle, film thickness, and substrate.

Additional Information:

Language: Interactive Design Language (IDL)

Operating System: PC

Hardware Requirements:

Availability:

• Maintenance/ Upgrades: No
• Source Code: Yes
• Cost: No
• Distribution: Disk/ftp
Manuals: Yes
• Training: No

Input Description: Refractive and Absorptive indices

Output Format: Graphical

Verification/ Validation: None

Point of Contact:

Bobby E. Wood
Bob Wood Aerospace Cnslt SRV
402 Lannom Circle
Tullahoma, TN  37388-2464

Phone:  931-455-0728
E-mail: bwacs@charter.net